Advanced Materials Characterization
Basic Principles, Novel Applications, and Future Directions
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
Specificaties
| ISBN/EAN | 9781032375113 |
| Auteur | Ch Sateesh (University of Johannesburg Kumar |
| Uitgever | Van Ditmar Boekenimport B.V. |
| Taal | Engels |
| Uitvoering | Paperback / gebrocheerd |
| Pagina's | 130 |
| Lengte | |
| Breedte |